Belkin, L.M. and Belkin, M.E. (2010) Research of VCSEL's Turn-on Delay Features. Journal of NANO and MICROSYSTEM TECHNIQUE (11).
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Official URL: http:// www.microsystems.ru
Abstract
A simple turn-on delay testing method for semiconductor laser with direct current modulation based on the digital oscilloscope's comparison of the wavefronts between device-under-test input impulse and the impulse after elecro-optical and optoelectrical conversions is proposed. The principles, measure technology, and results of VCSEL's turn-on delay feature measurements are described. The measurements accuracy is estimated. Keywords: long-wavelength vertical-cavity surface-emitting laser (VCSEL), turn-on delay measurement
| Item Type: | Article |
|---|---|
| Additional Information: | Full text is in Russian |
| ID Code: | 10330 |
| Deposited By: | Prof. Alexey Ivanov |
| Deposited On: | 08 Dec 2010 23:41 |
| Last Modified: | 09 Dec 2010 09:29 |
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