Nano Archive

Research of VCSEL's Turn-on Delay Features

Belkin, L.M. and Belkin, M.E. (2010) Research of VCSEL's Turn-on Delay Features. Journal of NANO and MICROSYSTEM TECHNIQUE (11).

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Official URL: http:// www.microsystems.ru

Abstract

A simple turn-on delay testing method for semiconductor laser with direct current modulation based on the digital oscilloscope's comparison of the wavefronts between device-under-test input impulse and the impulse after elecro-optical and optoelectrical conversions is proposed. The principles, measure technology, and results of VCSEL's turn-on delay feature measurements are described. The measurements accuracy is estimated. Keywords: long-wavelength vertical-cavity surface-emitting laser (VCSEL), turn-on delay measurement

Item Type:Article
Additional Information:Full text is in Russian
ID Code:10330
Deposited By:Prof. Alexey Ivanov
Deposited On:08 Dec 2010 23:41
Last Modified:09 Dec 2010 09:29

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