Kartashev, V.A. and Kartashev, V.V. (2010) STM Shape and Size Measurement. Journal of NANO and MICROSYSTEM TECHNIQUE (10).
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A software to determine the STM probe tip geometry by the interpretation of the surface topography measurements, taking the physical model of the scanning process into account, is described in the article. Processing of real measurements shows that the developed software makes it possible to determine the probe tip size with an accuracy of a fraction of nanometer. It is shown that the proposed technique is also applicable to AFM probes. Keywords: probe microscopy, tunneling microscope, interpretation of STM measurements, probe tip shape
|Additional Information:||Full text is in Russian|
|Deposited By:||Prof. Alexey Ivanov|
|Deposited On:||08 Dec 2010 23:41|
|Last Modified:||09 Dec 2010 09:29|
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