Nano Archive

STM Shape and Size Measurement

Kartashev, V.A. and Kartashev, V.V. (2010) STM Shape and Size Measurement. Journal of NANO and MICROSYSTEM TECHNIQUE (10).

Full text is not hosted in this archive but may be available via the Official URL, or by requesting a copy from the corresponding author.

Official URL: http:// www.microsystems.ru

Abstract

A software to determine the STM probe tip geometry by the interpretation of the surface topography measurements, taking the physical model of the scanning process into account, is described in the article. Processing of real measurements shows that the developed software makes it possible to determine the probe tip size with an accuracy of a fraction of nanometer. It is shown that the proposed technique is also applicable to AFM probes. Keywords: probe microscopy, tunneling microscope, interpretation of STM measurements, probe tip shape

Item Type:Article
Additional Information:Full text is in Russian
ID Code:10318
Deposited By:Prof. Alexey Ivanov
Deposited On:08 Dec 2010 23:41
Last Modified:09 Dec 2010 09:29

Repository Staff Only: item control page