Nano Archive

Test-Signal Generating for C-V Measurements

Pecherskaya, R.M. and Varenik, Yu.A. (2010) Test-Signal Generating for C-V Measurements. Journal of NANO and MICROSYSTEM TECHNIQUE (6).

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The article is about some problems of test-signal generating in C-V measurements of semiconductor structures. The unusual test-signal generating scheme based on principles of generators and load bridge connection was offered by authors. In this article was described the developed measuring equipment based on offered generators and load bridge connection. This article can be useful for C-V measurement systems developers and semiconductor nano- and microstructures investigators. Keywords: C-V measurements, C-V characteristics, MOS structures, semiconductor structures, test signal, impedance, network analyzer

Item Type:Article
Additional Information:Full text is in Russian
ID Code:10278
Deposited By:Prof. Alexey Ivanov
Deposited On:08 Dec 2010 23:40
Last Modified:09 Dec 2010 09:29

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