Nano Archive

Quality in Nanotechnology: Role of Metrology and Standardization

Okrepilov, V.V. (2009) Quality in Nanotechnology: Role of Metrology and Standardization. Journal of NANO and MICROSYSTEM TECHNIQUE (7).

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Official URL: http:// www.microsystems.ru

Abstract

The basic supporting pillars of quality are metrology and standardization. They cover all spheres of the economy including nanotechnology. Metrology enables to measure parameters and characteristics of processes and objects of nanoindustry with accuracy needed in the practice and ensures tracing physical units up to the national standard for each kind of measurement. Standardization allows using the standard terms and definitions. The stand­ards also lay down the optimum requirements to objects of nanoindustry and methods for their testing. The article will focus on problems and their solution in the fields of standardization, conformity assessment, information and technical backing of nanotechnologies and nanoproducts. Keywords: nanoindustry, nanotechnology, nanoproducts, metrology, measurement, measuring needs, traceabil-ity, verification, calibration, standardization, conformity conformation.

Item Type:Article
Additional Information:Full text is in Russian
ID Code:10171
Deposited By:Prof. Alexey Ivanov
Deposited On:08 Dec 2010 23:39
Last Modified:09 Dec 2010 09:29

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